Focus on silicon carbide epitaxial wafer for 15 years
Worlds leading silicon carbide epitaxial wafer manufacturers
TYSiC provides customers with high-sensitivity (ICP-MS) metal contamination detection services.
Detection service of metal contamination on wafer surface
TYSiC provides customers with high-sensitivity (ICP-MS) metal contamination detection services.
*ICP-MS：Inductively Coupled Plasma- Mass Spectrometer
